🔬 Workshop: Focused Ion Beam (FIB) — online!
Interested in learning how FIB and SEM technologies can support advanced semiconductor and materials analysis?
Join CC Chip.si’s Online Workshop on Focused Ion Beam (FIB) on 6 October 2026 at 9:00 AM CEST.
The interactive workshop will cover:
🔹 FIB capabilities and SEM/FIB fundamentals
🔹 Cross-section analysis and chip defect investigation
🔹 FIB deposition and etching
🔹 3D tomography and e-beam lithography
🔹 TEM lamella fabrication
🔹 Practical demonstration, applications and limitations of FIB technology
💡 What makes this workshop different?
It’s interactive. Participants can ask questions and request the operator to demonstrate the FIB tasks and applications that are most interesting to them.
📅 6 October 2026 | 09:00 CEST
💻 Online via Zoom
📝 Application deadline: 1 October 2026
🆓 Free attendance
Whether you are already working with electron microscopy or simply want to understand the possibilities of SEM and FIB, this workshop is a great opportunity to expand your practical knowledge.
👉 Apply now: CC Chip.si – Online FIB Workshop
Organised by CC Chip.si in collaboration with Nanocenter.